A comparative study on surface morphology from the HgIsub(2) semiconductors prepared by different techniques
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| Data(s) |
17/11/2014
18/11/2014
01/04/2015
17/11/2014
18/11/2014
01/04/2015
31/12/1969
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| Identificador | |
| Publicador |
Sao Paulo: ABEN, 2013 |
| Direitos |
openAccess |
| Fonte |
HGI2 SEMICONDUCTOR DETECTORS CRYSTAL GROWTH IMPURITIES MERCURY IODIDES SURFACE MORPHOLOGY STOICHIOMETRY DMSO |
| Palavras-Chave | #BIOMASS #ABSORBENTS #CHEMISORPTION #WASTEWATER #MOLYBDENUM IONS #TRACE TECHNIQUES #GAMMA SPECTROSCOPY #HIGH-PURITY GE DETECTORS |
| Tipo |
Texto completo de evento |
