Piezoresponse force microscopy investigations of Aurivillius phase thin films
| Data(s) |
16/08/2016
16/08/2016
31/08/2010
03/09/2014
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| Resumo |
The sol-gel synthesis and characterization of n≥3n≥3 Aurivillius phase thin filmsdeposited on Pt/Ti/SiO2–SiPt/Ti/SiO2–Si substrates is described. The number of perovskite layers, nn, was increased by inserting BiFeO3BiFeO3 into three layered Aurivillius phase Bi4Ti3O12Bi4Ti3O12 to form compounds such as Bi5FeTi3O15Bi5FeTi3O15 (n=4)(n=4). 30% of the Fe3+Fe3+ ions in Bi5FeTi3O15Bi5FeTi3O15 were substituted with Mn3+Mn3+ ions to form the structureBi5Ti3Fe0.7Mn0.3O15Bi5Ti3Fe0.7Mn0.3O15. The electromechanical responses of the materials were investigated using piezoresponse force microscopy and the results are discussed in relation to the crystallinity of the films as measured by x-ray diffraction. |
| Formato |
application/pdf |
| Identificador |
Keeney, L., Zhang, P. F., Groh, C., Pemble, M. E. and Whatmore, R. W. (2010) ‘Piezoresponse force microscopy investigations of Aurivillius phase thin films’, Journal of Applied Physics, 108, 042004. http://dx.doi.org/10.1063/1.3474959 108 042004-1 042004-9 0021-8979 1089-7550 http://hdl.handle.net/10468/2991 10.1063/1.3474959 Journal of Applied Physics 042004 |
| Idioma(s) |
en |
| Publicador |
AIP Publishing |
| Direitos |
© 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in L. Keeney et al., J. Appl. Phys. 108, 042004 (2010) and may be found at http://dx.doi.org/10.1063/1.3474959 |
| Palavras-Chave | #Annealing #Atomic force microscopy #X-ray diffraction #Polarization #Sols |
| Tipo |
Article (peer-reviewed) |
