Average and reliability error exponents in low-density parity-check codes
| Data(s) |
15/10/2003
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| Resumo |
We present a theoretical method for a direct evaluation of the average and reliability error exponents in low-density parity-check error-correcting codes using methods of statistical physics. Results for the binary symmetric channel are presented for codes of both finite and infinite connectivity. |
| Formato |
application/pdf |
| Identificador |
http://eprints.aston.ac.uk/1363/1/NCRG_2003_005.pdf Skantzos, Nikos; van Mourik, Jort; Saad, David and Kabashima, Yoshiyuki (2003). Average and reliability error exponents in low-density parity-check codes. Journal of Physics A: Mathematical and General, 36 (43), pp. 11131-11141. |
| Relação |
http://eprints.aston.ac.uk/1363/ |
| Tipo |
Article PeerReviewed |
