Average and reliability error exponents in low-density parity-check codes


Autoria(s): Skantzos, Nikos; van Mourik, Jort; Saad, David; Kabashima, Yoshiyuki
Data(s)

15/10/2003

Resumo

We present a theoretical method for a direct evaluation of the average and reliability error exponents in low-density parity-check error-correcting codes using methods of statistical physics. Results for the binary symmetric channel are presented for codes of both finite and infinite connectivity.

Formato

application/pdf

Identificador

http://eprints.aston.ac.uk/1363/1/NCRG_2003_005.pdf

Skantzos, Nikos; van Mourik, Jort; Saad, David and Kabashima, Yoshiyuki (2003). Average and reliability error exponents in low-density parity-check codes. Journal of Physics A: Mathematical and General, 36 (43), pp. 11131-11141.

Relação

http://eprints.aston.ac.uk/1363/

Tipo

Article

PeerReviewed