Evaluation of hot-carrier induced degradation in MOSFETs by measurement at cryogenic temperatures

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Autoria(s): Yao, Sherry Shu-Ting

Data(s)	01/01/2000
Identificador	http://espace.library.uq.edu.au/view/UQ:105559
Idioma(s)	eng
Publicador	The University of Queensland, School of Computer Science and Electrical Engineering
Palavras-Chave	#L #299999 Engineering and Technology not elsewhere classified #660300 Energy Storage and Distribution
Tipo	Thesis