Investigations of hot-carrier induced interface damages via small-signal characteristics of drain-to-substrate gated-diode

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Autoria(s): Lau, M. P.; Hsu, C. T.; Yeow, T.Y.T.

Contribuinte(s)	W. Tan K Pey W. Chim J. Thong
Data(s)	01/01/2001
Identificador	http://espace.library.uq.edu.au/view/UQ:96336
Idioma(s)	eng
Publicador	IEEE
Palavras-Chave	#EX #290902 Integrated Circuits #671201 Integrated circuits and devices
Tipo	Conference Paper