Evaluation of Laminar Defects in Beams Using Guided Waves and Pattern Recognition Techniques

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Autoria(s): Liew, C. K.; Veidt, M.

Contribuinte(s)	Prof H. Hao Prof A. Deeks and Dr Yong Xia
Data(s)	01/01/2005
Identificador	http://espace.library.uq.edu.au/view/UQ:103137
Idioma(s)	eng
Publicador	CI-Premier Conference Organisation
Palavras-Chave	#EX #290501 Mechanical Engineering #680305 Metals (composites, coatings, bonding, etc.)
Tipo	Conference Paper