Investigation of SiO2-SiC interface by high-resolution transmission electron microscope

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Autoria(s): Dimitriejev, S.; Han, J.; Zou, J.

Contribuinte(s)	Fred H Wohlbier Graeme Murch Yiu-Wing Mai
Data(s)	01/01/2006
Identificador	http://espace.library.uq.edu.au/view/UQ:83155
Idioma(s)	eng
Publicador	Trans Tech Publications Ltd.
Palavras-Chave	#C1 #291804 Nanotechnology #240202 Condensed Matter Physics - Structural Properties #291499 Materials Engineering not elsewhere classified #780102 Physical sciences #680399 Other #671699 Manufactured products not elsewhere classified
Tipo	Journal Article