Effect of deposition conditions on mechanical properties of low-temperature PECVD silicon nitride films


Autoria(s): Huang, H.; Winchester, K. J.; Suvorova, A.; Lawn, B. R.; Liu, Y.; Hu, X. Z.; Dell, J. M.; Faraone, L.
Contribuinte(s)

Dr. G Kostorz

M Kato

Data(s)

01/01/2006

Resumo

The effect of deposition conditions on characteristic mechanical properties - elastic modulus and hardness - of low-temperature PECVD silicon nitrides is investigated using nanoindentation. lt is found that increase in substrate temperature, increase in plasma power and decrease in chamber gas pressure all result in increases in elastic modulus and hardness. Strong correlations between the mechanical properties and film density are demonstrated. The silicon nitride density in turn is shown to be related to the chemical composition of the films, particularly the silicon/nitrogen ratio. (c) 2006 Elsevier B.V. All rights reserved.

Identificador

http://espace.library.uq.edu.au/view/UQ:82113

Idioma(s)

eng

Publicador

Elsevier S.A.

Palavras-Chave #Nanoscience & Nanotechnology #Materials Science, Multidisciplinary #Elastic Modulus #Hardness #Pecvd #Silicon Nitride #Thin Film #Nanoindentation #Thin-films #Sinxhy Deposition #Elastic-modulus #Optical Filters #Plasma #Indentation #Stress #C1 #291804 Nanotechnology #671499 Instrumentation not elsewhere classified
Tipo

Journal Article