TEM characterization of nanostructure and chemistry of semiconductor quantum structures
| Contribuinte(s) |
Zhuangqi Hu (Editor-in-Chief) |
|---|---|
| Data(s) |
01/01/2005
|
| Resumo |
The power of advanced transmission electron microscopy in determining the nanostructures and chemistry of nanosized materials on the applications in semiconductor quantum structures was demonstrated. |
| Identificador | |
| Idioma(s) |
eng |
| Publicador |
Journal of Materials Science & Technology |
| Palavras-Chave | #Materials Science, Multidisciplinary #Metallurgy & Metallurgical Engineering #Tem #Semiconductor #Dislocation #Quantum Wells #Quantum Dots #Misfit Dislocation Generation #Field Diffraction Contrast #Molecular-beam Epitaxy #Single Heterostructures #Inhomogeneous Sources #Islands #Interdiffusion #Si(001) #Wells #Hrem #C1 #291499 Materials Engineering not elsewhere classified #291804 Nanotechnology #670799 Other |
| Tipo |
Journal Article |
