The measurement of intelligence; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale.


Autoria(s): Terman, Lewis M. (Lewis Madison), 1877-1956.
Data(s)

31/12/1969

Resumo

Photocopy.

Mode of access: Internet.

Formato

bib

Identificador

http://hdl.handle.net/2027/uc1.b4152417

Idioma(s)

eng

Publicador

Boston : Houghton Mifflin company

Direitos

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Palavras-Chave #Stanford-Binet Test.
Tipo

text