Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974 /


Autoria(s): Materials Research Symposium (7th : 1974 : Gaithersburg, Md.); LaFleur, Philip D.
Data(s)

26/12/1976

Resumo

Includes bibliographical references.

Mode of access: Internet.

Formato

bib

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Identificador

http://hdl.handle.net/2027/uc1.l0065494668

http://hdl.handle.net/2027/uc1.l0065494676

http://hdl.handle.net/2027/uiug.30112017522613

http://hdl.handle.net/2027/uiug.30112017522621

http://hdl.handle.net/2027/uc1.31822020598702

http://hdl.handle.net/2027/uc1.31822020598769

http://hdl.handle.net/2027/mdp.39015086529727

http://hdl.handle.net/2027/mdp.39015086529735

http://hdl.handle.net/2027/mdp.39015016088075

http://hdl.handle.net/2027/mdp.39015016088067

http://hdl.handle.net/2027/mdp.39015008066287

http://hdl.handle.net/2027/mdp.39015007461208

Idioma(s)

eng

Publicador

Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,

Direitos

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Palavras-Chave #Trace elements
Tipo

text