Biblioteca Digital

Transactions of the American Institute of Electrical Engineers

**Autoria(s):** American Institute of Electrical Engineers
Resumo	Mode of access: Internet.
Formato	gfv bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib gfv bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib
Identificador	http://hdl.handle.net/2027/uc1.31822004076766 http://hdl.handle.net/2027/mdp.39015068182719 http://hdl.handle.net/2027/mdp.39015068182495 http://hdl.handle.net/2027/mdp.39015068171811 http://hdl.handle.net/2027/mdp.39015068171662 http://hdl.handle.net/2027/mdp.39015068171803 http://hdl.handle.net/2027/uc1.a0005574652 http://hdl.handle.net/2027/uc1.a0007588239 http://hdl.handle.net/2027/uiug.30112007446955 http://hdl.handle.net/2027/uc1.a0013879374 http://hdl.handle.net/2027/uc1.a0013879382 http://hdl.handle.net/2027/mdp.39015026526759 http://hdl.handle.net/2027/mdp.39015010794835 http://hdl.handle.net/2027/mdp.39015030594314 http://hdl.handle.net/2027/mdp.39015036763228 http://hdl.handle.net/2027/mdp.39015026526841 http://hdl.handle.net/2027/mdp.39015013138410 http://hdl.handle.net/2027/mdp.39015026526775 http://hdl.handle.net/2027/mdp.39015068182404 http://hdl.handle.net/2027/mdp.39015068182412 http://hdl.handle.net/2027/mdp.39015068182420 http://hdl.handle.net/2027/mdp.39015068182438 http://hdl.handle.net/2027/mdp.39015068182446 http://hdl.handle.net/2027/mdp.39015068182453 http://hdl.handle.net/2027/mdp.39015068182461 http://hdl.handle.net/2027/mdp.39015068182479 http://hdl.handle.net/2027/mdp.39015068182487 http://hdl.handle.net/2027/mdp.39015068182503 http://hdl.handle.net/2027/mdp.39015068182511 http://hdl.handle.net/2027/mdp.39015068171720 http://hdl.handle.net/2027/mdp.39015068171878 http://hdl.handle.net/2027/mdp.39015068171860 http://hdl.handle.net/2027/mdp.39015068171712 http://hdl.handle.net/2027/mdp.39015068172009 http://hdl.handle.net/2027/mdp.39015068171852 http://hdl.handle.net/2027/mdp.39015068171704 http://hdl.handle.net/2027/mdp.39015068171977 http://hdl.handle.net/2027/mdp.39015068171993 http://hdl.handle.net/2027/mdp.39015068171985 http://hdl.handle.net/2027/mdp.39015068171845 http://hdl.handle.net/2027/mdp.39015068171696 http://hdl.handle.net/2027/mdp.39015068171837 http://hdl.handle.net/2027/mdp.39015068171688 http://hdl.handle.net/2027/mdp.39015068171829 http://hdl.handle.net/2027/mdp.39015068171670 http://hdl.handle.net/2027/mdp.39015068171969 http://hdl.handle.net/2027/mdp.39015068171944 http://hdl.handle.net/2027/mdp.39015068171951 http://hdl.handle.net/2027/mdp.39015068171936 http://hdl.handle.net/2027/mdp.39015068171928 http://hdl.handle.net/2027/mdp.39015068171910 http://hdl.handle.net/2027/mdp.39015068171902 http://hdl.handle.net/2027/mdp.39015068171795 http://hdl.handle.net/2027/mdp.39015068171787 http://hdl.handle.net/2027/mdp.39015068171779 http://hdl.handle.net/2027/mdp.39015068171761 http://hdl.handle.net/2027/mdp.39015068171753 http://hdl.handle.net/2027/mdp.39015068171605 http://hdl.handle.net/2027/mdp.39015068171654
Idioma(s)	eng
Publicador	New York, American Institute of Electrical Engineers
Relação	IEEE transactions Proceedings
Direitos	Items in this record are available as Public Domain in the United States, as Google-digitized, and as Public Domain. View the access and use profile at http://www.hathitrust.org/access_use#pd-us-google, http://www.hathitrust.org/access_use#pd-google, and http://www.hathitrust.org/access_use#pd. Please see individual items for rights and use statements.
Palavras-Chave	#Electrical engineering
Tipo	text

Acesso ao item digital