Semiconductor measurement technology : reliability technology for cardiac pacemakers II, a workshop report /


Autoria(s): Reliability Technology for Cardiac Pacemakers II (1976 : National Bureau of Standards); Schafft, Harry A. editor.; Institute for Applied Technology (U.S.). Electronic Technology Division.
Data(s)

29/12/1977

Resumo

Mode of access: Internet.

Formato

bib

bib

bib

Identificador

http://hdl.handle.net/2027/uc1.31210023555681

http://hdl.handle.net/2027/uiug.30112104076747

http://hdl.handle.net/2027/mdp.39015077585068

Idioma(s)

eng

Publicador

Washington : Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,

Direitos

Items in this record are available as Public Domain, Google-digitized. View access and use profile at http://www.hathitrust.org/access_use#pd-google. Please see individual items for rights and use statements.

Palavras-Chave #Cardiac pacemakers
Tipo

text