A study of evaporated aluminum films by X-ray total reflection,
| Data(s) |
29/09/2024
|
|---|---|
| Resumo |
Contract no. AF 18(600)-300. File no. R-355-20-1. ASTIA AD 162 212. AFOSR TN 58-680. Mode of access: Internet. |
| Formato |
bib |
| Identificador | |
| Idioma(s) |
eng |
| Publicador |
Washington, Solid State Sciences Division, Air Force Office of Scientific Research, Air Research and Development Command; Ithaca, N.Y., Dept. of Physics, Cornell University, |
| Direitos |
Items in this record are available as Public Domain, Google-digitized. View access and use profile at http://www.hathitrust.org/access_use#pd-google. Please see individual items for rights and use statements. |
| Palavras-Chave | #Surface chemistry #Metallic films #Aluminum #X-ray spectroscopy |
| Tipo |
text |
