An automated photovoltaic system for the measurement of resistivity variations, in high-resistivity circular silicon slices /
| Data(s) |
29/12/1979
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|---|---|
| Resumo |
Includes bibliographical references. Mode of access: Internet. |
| Formato |
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| Identificador | |
| Idioma(s) |
eng |
| Publicador |
Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., |
| Relação |
Automated photovoltaic system for the measurement of resistivity variations, in high-resistivity circular silicon slices. |
| Direitos |
Items in this record are available as Public Domain in the United States, Google-digitized. View access and use profile at http://www.hathitrust.org/access_use#pd-us-google. Please see individual items for rights and use statements. |
| Palavras-Chave | #Semiconductor industry #Silicon #Semiconductor wafers #Semiconductors |
| Tipo |
text |
