Biblioteca Digital

Proceedings of the American Institute of Electrical Engineers.

**Autoria(s):** American Institute of Electrical Engineers.
Resumo	Mode of access: Internet. Continues the monthly edition of: Transactions of the American Institute of Electrical Engineers, ISSN 0096-3860, and adopts its volume numbering. Includes preprints of: Transactions of the American Institute of Electrical Engineers, ISSN 0096-3860.
Formato	bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib bib
Identificador	http://hdl.handle.net/2027/iau.31858046100867 http://hdl.handle.net/2027/umn.31951d001188793 http://hdl.handle.net/2027/umn.31951d001188874 http://hdl.handle.net/2027/umn.31951d00118867a http://hdl.handle.net/2027/umn.31951d001188688 http://hdl.handle.net/2027/umn.31951d00118864g http://hdl.handle.net/2027/umn.31951d001188777 http://hdl.handle.net/2027/umn.31951d00118863i http://hdl.handle.net/2027/umn.31951d00118880i http://hdl.handle.net/2027/umn.31951d001188696 http://hdl.handle.net/2027/umn.31951d00118866c http://hdl.handle.net/2027/umn.31951d001188858 http://hdl.handle.net/2027/umn.31951d001188785 http://hdl.handle.net/2027/umn.31951d00118882e http://hdl.handle.net/2027/umn.31951d00118881g http://hdl.handle.net/2027/umn.31951d00118884a http://hdl.handle.net/2027/umn.31951d00118874d http://hdl.handle.net/2027/umn.31951d00118883c http://hdl.handle.net/2027/umn.31951d00118871j http://hdl.handle.net/2027/umn.31951d00118875b http://hdl.handle.net/2027/iau.31858046100883 http://hdl.handle.net/2027/iau.31858046101089 http://hdl.handle.net/2027/iau.31858046101113 http://hdl.handle.net/2027/mdp.39015049807012 http://hdl.handle.net/2027/mdp.39015075024235 http://hdl.handle.net/2027/mdp.39015075024227 http://hdl.handle.net/2027/mdp.39015075024201 http://hdl.handle.net/2027/mdp.39015075024193 http://hdl.handle.net/2027/mdp.39015075024185 http://hdl.handle.net/2027/mdp.39015075024177 http://hdl.handle.net/2027/mdp.39015075024169 http://hdl.handle.net/2027/mdp.39015075024151 http://hdl.handle.net/2027/mdp.39015075024300 http://hdl.handle.net/2027/mdp.39015075024318 http://hdl.handle.net/2027/mdp.39015075024326 http://hdl.handle.net/2027/mdp.39015075024334 http://hdl.handle.net/2027/mdp.39015075024342 http://hdl.handle.net/2027/mdp.39015075024359 http://hdl.handle.net/2027/mdp.39015075024367 http://hdl.handle.net/2027/uc1.b2861782 http://hdl.handle.net/2027/uc1.b2861783 http://hdl.handle.net/2027/uc1.b2861784 http://hdl.handle.net/2027/uc1.b2861785 http://hdl.handle.net/2027/uc1.b2861786 http://hdl.handle.net/2027/uc1.b2861787 http://hdl.handle.net/2027/uc1.b2861788 http://hdl.handle.net/2027/uc1.b2861789 http://hdl.handle.net/2027/uc1.b2861790 http://hdl.handle.net/2027/uc1.b2861954 http://hdl.handle.net/2027/uc1.b2861955 http://hdl.handle.net/2027/uc1.b2861959 http://hdl.handle.net/2027/uc1.b2861960 http://hdl.handle.net/2027/uc1.b2861961 http://hdl.handle.net/2027/uc1.b2861962 http://hdl.handle.net/2027/uc1.b2861963 http://hdl.handle.net/2027/uc1.b2861964 http://hdl.handle.net/2027/uc1.b2861965 http://hdl.handle.net/2027/uc1.b2861966
Idioma(s)	eng
Publicador	[New York, American Institute of Electrical Engineers]
Relação	Journal of the American Institute of Electrical Engineers Transactions of the American Institute of Electrical Engineers
Direitos	Items in this record are available as Public Domain, Google-digitized. View access and use profile at http://www.hathitrust.org/access_use#pd-google. Please see individual items for rights and use statements.
Tipo	text

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