Geochemistry of ODP Hole 128-798B
Cobertura |
LATITUDE: 37.038500 * LONGITUDE: 134.799600 * DATE/TIME START: 1989-08-28T10:24:00 * DATE/TIME END: 1989-08-31T08:00:00 |
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Data(s) |
15/03/1992
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Resumo |
The capability of determining elemental concentrations through geochemical logging has recently been established. However, the quality of these data obtained in some environments has yet to be quantified. We assess the quality of geochemical logs compared with XRF results from a suite of core samples from Hole 798B. The resulting core/log correlations are only fair, because the tool has been adversely affected by the very high porosity of the formation. The results, however, do fall within the statistical uncertainties predicted by the processing. The recent application of a modified boron sleeve to the Ocean Drilling Program's geochemical logging tool is shown to reduce interference of borehole chlorine on the resultant chemistry. |
Formato |
application/zip, 3 datasets |
Identificador |
https://doi.pangaea.de/10.1594/PANGAEA.777708 doi:10.1594/PANGAEA.777708 |
Idioma(s) |
en |
Publicador |
PANGAEA |
Direitos |
CC-BY: Creative Commons Attribution 3.0 Unported Access constraints: unrestricted |
Fonte |
Supplement to: Bristow, James F; deMenocal, Peter B (1992): Evaluation of quality of geochemical log data in ODP Hole 798B. In: Tamaki, K; Suychiro, K; Allan, J; McWilliams, M; et al. (eds.), Proceedings of the Ocean Drilling Program, Scientific Results, College Station, TX (Ocean Drilling Program), 127/128(2), 1021-1035, doi:10.2973/odp.proc.sr.127128-2.221.1992 |
Palavras-Chave | #128-798B; Al2O3; Aluminium oxide; Calcium oxide; CaO; corrected depth = depth in mbsf as determined from terrigenous log/SGR correlation; Depth; Depth, reconstructed; DEPTH, sediment/rock; DRILL; Drilling/drill rig; Elements, total; Fe2O3; Iron oxide, Fe2O3; Japan Sea; Joides Resolution; K2O; Label; Label 2; Leg128; Magnesium oxide; Manganese oxide; mbsf; MgO; MnO; Na2O; Ocean Drilling Program; ODP; ODP sample designation; P2O5; Phosphorus oxide; Potassium oxide; Reconstr depth; Sample code/label; Sample code/label 2; Silicon dioxide; SiO2; Sodium oxide; TiO2; Titanium oxide; total; X-ray fluorescence (XRF) |
Tipo |
Dataset |