The Moldable Inspector


Autoria(s): Chis, Vasile-Andrei; Girba, Tudor Adrian; Nierstrasz, Oscar Marius; Syrel, Aliaksei
Data(s)

2015

Resumo

Object inspectors are an essential category of tools that allow developers to comprehend the run-time of object-oriented systems. Traditional object inspectors favor a generic view that focuses on the low-level details of the state of single objects. Based on 16 interviews with software developers and a follow-up survey with 62 respondents we identified a need for object inspectors that support different high-level ways to visualize and explore objects, depending on both the object and the current developer need. We propose the Moldable Inspector, a novel inspector model that enables developers to adapt the inspection workflow to suit their immediate needs by making the inspection context explicit, providing multiple interchangeable domain-specific views for each object, and supporting a workflow that groups together multiple levels of connected objects. We show that the Moldable Inspector can address multiple kinds of development needs involving a wide range of objects.

Formato

application/pdf

Identificador

http://boris.unibe.ch/82272/1/Chis15a-MoldableInspector.pdf

Chis, Vasile-Andrei; Girba, Tudor Adrian; Nierstrasz, Oscar Marius; Syrel, Aliaksei (2015). The Moldable Inspector. In: Proceedings of the 2015 ACM International Symposium on New Ideas, New Paradigms, and Reflections on Programming and Software. Onward! 2015 (pp. 44-60). New York, NY, USA: ACM 10.1145/2814228.2814234 <http://dx.doi.org/10.1145/2814228.2814234>

doi:10.7892/boris.82272

info:doi:10.1145/2814228.2814234

Idioma(s)

eng

Publicador

ACM

Relação

http://boris.unibe.ch/82272/

Direitos

info:eu-repo/semantics/restrictedAccess

Fonte

Chis, Vasile-Andrei; Girba, Tudor Adrian; Nierstrasz, Oscar Marius; Syrel, Aliaksei (2015). The Moldable Inspector. In: Proceedings of the 2015 ACM International Symposium on New Ideas, New Paradigms, and Reflections on Programming and Software. Onward! 2015 (pp. 44-60). New York, NY, USA: ACM 10.1145/2814228.2814234 <http://dx.doi.org/10.1145/2814228.2814234>

Palavras-Chave #000 Computer science, knowledge & systems #510 Mathematics
Tipo

info:eu-repo/semantics/conferenceObject

info:eu-repo/semantics/publishedVersion

PeerReviewed