A Hardware-Software Approach for On-Line Soft Error Mitigation in Interrupt-Driven Applications
Contribuinte(s) |
Universidad de Alicante. Departamento de Tecnología Informática y Computación UniCAD: Grupo de investigación en CAD/CAM/CAE de la Universidad de Alicante |
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Data(s) |
12/07/2016
12/07/2016
13/07/2016
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Resumo |
Integrity assurance of configuration data has a significant impact on microcontroller-based systems reliability. This is especially true when running applications driven by events which behavior is tightly coupled to this kind of data. This work proposes a new hybrid technique that combines hardware and software resources for detecting and recovering soft-errors in system configuration data. Our approach is based on the utilization of a common built-in microcontroller resource (timer) that works jointly with a software-based technique, which is responsible to periodically refresh the configuration data. The experiments demonstrate that non-destructive single event effects can be effectively mitigated with reduced overheads. Results show an important increase in fault coverage for SEUs and SETs, about one order of magnitude. This work was funded in part by the Spanish Ministry of Education, Culture and Sports with the project “Developing hybrid fault tolerance techniques for embedded microprocessors” (PHB2012–0158-PC). |
Identificador |
IEEE Transactions on Dependable and Secure Computing. 2016, 13(4): 502-508. doi:10.1109/TDSC.2014.2382593 1545-5971 1941-0018 (Online) http://hdl.handle.net/10045/56649 10.1109/TDSC.2014.2382593 |
Idioma(s) |
eng |
Publicador |
IEEE |
Relação |
http://dx.doi.org/10.1109/TDSC.2014.2382593 |
Direitos |
© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. info:eu-repo/semantics/openAccess |
Palavras-Chave | #Single Event Upset (SEU) #Single Event Transient (SET) #Fault tolerance #Soft error mitigation #Radiation effects #Arquitectura y Tecnología de Computadores |
Tipo |
info:eu-repo/semantics/article |