Efficient Mitigation of Data and Control Flow Errors in Microprocessors


Autoria(s): Parra, Luis; Lindoso, Almudena; Portela, Marta; Entrena, Luis; Restrepo Calle, Felipe; Cuenca-Asensi, Sergio; Martínez-Álvarez, Antonio
Contribuinte(s)

Universidad de Alicante. Departamento de Tecnología Informática y Computación

UniCAD: Grupo de investigación en CAD/CAM/CAE de la Universidad de Alicante

Data(s)

26/03/2015

26/03/2015

01/08/2014

Resumo

The use of microprocessor-based systems is gaining importance in application domains where safety is a must. For this reason, there is a growing concern about the mitigation of SEU and SET effects. This paper presents a new hybrid technique aimed to protect both the data and the control-flow of embedded applications running on microprocessors. On one hand, the approach is based on software redundancy techniques for correcting errors produced in the data. On the other hand, control-flow errors can be detected by reusing the on-chip debug interface, existing in most modern microprocessors. Experimental results show an important increase in the system reliability even superior to two orders of magnitude, in terms of mitigation of both SEUs and SETs. Furthermore, the overheads incurred by our technique can be perfectly assumable in low-cost systems.

This work was supported in part by the Spanish Government under contracts TEC2010-22095-C03-03 and PHB2012-0158-PC.

Identificador

IEEE Transactions on Nuclear Science. 2014, 61(4): 1590-1596. doi:10.1109/TNS.2014.2310492

0018-9499 (Print)

1558-1578 (Online)

http://hdl.handle.net/10045/46072

10.1109/TNS.2014.2310492

Idioma(s)

eng

Publicador

IEEE

Relação

http://dx.doi.org/10.1109/TNS.2014.2310492

Direitos

© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works

info:eu-repo/semantics/openAccess

Palavras-Chave #Fault tolerance #Microprocessor #Single event transient (SETs) #Single event upset (SEUs) #Soft error #Arquitectura y Tecnología de Computadores
Tipo

info:eu-repo/semantics/article