Module optical analyzer: Identification of defects on the production line
| Data(s) |
2014
|
|---|---|
| Resumo |
The usefulness of the module optical analyzer when identifying module defects on production line is presented in this paper. Two different case studies performed with two different kind of CPV modules are presented to show the use of MOA both in IES-UPM and Daido Steel facilities. |
| Formato |
application/pdf |
| Identificador | |
| Idioma(s) |
eng |
| Relação |
http://oa.upm.es/38845/1/INVE_MEM_2014_213546.pdf http://dx.doi.org/10.1063/1.4897042 info:eu-repo/grantAgreement/EC/FP7/283798 S2009/ENE-1477 |
| Direitos |
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ info:eu-repo/semantics/openAccess |
| Fonte |
10th International Conference on Concentrator Photovoltaic Systems (CPV-10) | 10th International Conference on Concentrator Photovoltaic Systems (CPV-10) | 07/04/2014 - 09/04/2014 | Albuquerque, New Mexico, USA |
| Palavras-Chave | #Electrónica |
| Tipo |
info:eu-repo/semantics/conferenceObject Ponencia en Congreso o Jornada PeerReviewed |
