Method for electrical evaluation of graphene using a GFET structure
| Data(s) |
2014
|
|---|---|
| Resumo |
n this work, we explain a method to characterize graphene using electrical measurements in graphene field-effect transistors (GFET) devices. Our goal is to obtain the material electronic properties from the output characteristics of one GFET device. For the previous purpose, we will need to apply a physical model that allows us to correlate the electronic behavior of a GFET with the material properties. |
| Formato |
application/pdf |
| Identificador | |
| Idioma(s) |
eng |
| Publicador |
E.T.S.I. Telecomunicación (UPM) |
| Relação |
http://oa.upm.es/36472/1/INVE_MEM_2014_193805.pdf TEC 2010-19511 CSD 2009-00046 RUE |
| Direitos |
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ info:eu-repo/semantics/openAccess |
| Fonte |
4th edition of Graphene Conference | 4th edition of Graphene Conference | 06/05/2014 - 09/05/2014 | Toulouse, Francia |
| Palavras-Chave | #Telecomunicaciones #Electrónica |
| Tipo |
info:eu-repo/semantics/conferenceObject Ponencia en Congreso o Jornada PeerReviewed |
