Did you evaluate your ontology? OOPS! (OntOlogy Pitfall Scanner!)
| Data(s) |
2012
|
|---|---|
| Resumo |
The application of methodologies for building ontologies can improve ontology quality. However, such quality is not guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or bad practices within the ontology development. In this context, our aim is to describe OOPS!(OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies. |
| Formato |
application/pdf |
| Identificador | |
| Idioma(s) |
eng |
| Publicador |
Facultad de Informática (UPM) |
| Relação |
http://oa.upm.es/20287/1/INVE_MEM_2012_137604.pdf info:eu-repo/semantics/altIdentifier/doi/null |
| Direitos |
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ info:eu-repo/semantics/openAccess |
| Fonte |
Proceedings 18th International Conference, EKAW 2012 | 18th International Conference, EKAW 2012 | 08/10/2012 - 12/10/2012 | Galway City, Ireland |
| Palavras-Chave | #Informática |
| Tipo |
info:eu-repo/semantics/conferenceObject Ponencia en Congreso o Jornada PeerReviewed |
