In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2
| Data(s) |
2012
|
|---|---|
| Resumo |
Outline: • Motivation, aim • Complement waveguide data on silica • Optical data in quartz • Detailed analysis, i.e. both fluence kinetics and resolution • Efficiency of irradiation and analysis, samples, time... • Experimental set-up description • Reflectance procedure • Options: light source (lasers, white light..), detectors, configurations • Results and discussion • Comparative of amorphous and crystalline phases |
| Formato |
application/pdf |
| Identificador | |
| Idioma(s) |
eng |
| Publicador |
E.T.S.I. Industriales (UPM) |
| Relação |
http://oa.upm.es/19680/1/INVE_MEM_2012_130311.pdf info:eu-repo/semantics/altIdentifier/doi/null |
| Direitos |
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ info:eu-repo/semantics/openAccess |
| Fonte |
18th International Conference on Ion Beam Modifications of Materials (IBMM 2012) | 18th International Conference on Ion Beam Modifications of Materials (IBMM 2012) | 02/09/2012 - 07/09/2012 | Quingdao, China |
| Palavras-Chave | #Optica |
| Tipo |
info:eu-repo/semantics/conferenceObject Ponencia en Congreso o Jornada PeerReviewed |
