Did you validate your ontology? OOPS!
| Data(s) |
01/05/2012
|
|---|---|
| Resumo |
The application of methodologies for building ontologies can im-prove ontology quality. However, such quality is not guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or bad practices within the ontology development. Sev-eral authors have provided lists of typical anomalies detected in ontologies dur-ing the last decade. In this context, our aim in this paper is to describe OOPS! (OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies. |
| Formato |
application/pdf |
| Identificador | |
| Idioma(s) |
spa |
| Publicador |
Facultad de Informática (UPM) |
| Relação |
http://oa.upm.es/14478/1/demoOOPSeswc2012_CRv2.pdf |
| Direitos |
(c) Editor/Autor info:eu-repo/semantics/openAccess |
| Fonte |
9ª Extended Semantic Web Conference (ESWC2012) | 9ª Extended Semantic Web Conference (ESWC2012) | 27 - 31 May, 2012 | Heraklion, Grecia |
| Palavras-Chave | #Informática |
| Tipo |
info:eu-repo/semantics/conferenceObject Ponencia en Congreso o Jornada PeerReviewed |
