Structural properties of InAlN single layers nearly latice-matched to GaN grown by plasma assisted molecular beal epitaxy
Data(s) |
2011
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Resumo |
The high lattice mismatch between III-nitride binaries (InN, GaN and AlN) remains a key problem to grow high quality III-nitride heterostructures. Recent interest has been focused on the growth of high-quality InAlN layers, with approximately 18% of indium incorporation, in-plane lattice-matched (LM) to GaN. While a lot of work has been done by metal-organic vapour phase epitaxy (MOVPE) by Carlin and co-workers, its growth by molecular beam epitaxy (MBE) is still in infancy |
Formato |
application/pdf |
Identificador | |
Idioma(s) |
eng |
Publicador |
E.T.S.I. Telecomunicación (UPM) |
Relação |
http://oa.upm.es/13380/1/INVE_MEM_2011_95262.pdf http://embe2011.neel.cnrs.fr/spip.php?article39 info:eu-repo/semantics/altIdentifier/doi/00000 |
Direitos |
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ info:eu-repo/semantics/openAccess |
Fonte |
Proceedings of 16th European Molecular Beam Epitaxy Workshop, Euro MEB 2011 | 16th European Molecular Beam Epitaxy Workshop, Euro MEB 2011 | 20/03/2011 - 23/03/2011 | AlpesFranceses, Francia |
Palavras-Chave | #Electrónica |
Tipo |
info:eu-repo/semantics/conferenceObject Ponencia en Congreso o Jornada PeerReviewed |