Structural properties of InAlN single layers nearly latice-matched to GaN grown by plasma assisted molecular beal epitaxy


Autoria(s): Gacevic, Zarko; Fernández-Garrido, Sergio; Calleja Pardo, Enrique; Hosseini, D.; Estradé, S.; Peiró, F.
Data(s)

2011

Resumo

The high lattice mismatch between III-nitride binaries (InN, GaN and AlN) remains a key problem to grow high quality III-nitride heterostructures. Recent interest has been focused on the growth of high-quality InAlN layers, with approximately 18% of indium incorporation, in-plane lattice-matched (LM) to GaN. While a lot of work has been done by metal-organic vapour phase epitaxy (MOVPE) by Carlin and co-workers, its growth by molecular beam epitaxy (MBE) is still in infancy

Formato

application/pdf

Identificador

http://oa.upm.es/13380/

Idioma(s)

eng

Publicador

E.T.S.I. Telecomunicación (UPM)

Relação

http://oa.upm.es/13380/1/INVE_MEM_2011_95262.pdf

http://embe2011.neel.cnrs.fr/spip.php?article39

info:eu-repo/semantics/altIdentifier/doi/00000

Direitos

http://creativecommons.org/licenses/by-nc-nd/3.0/es/

info:eu-repo/semantics/openAccess

Fonte

Proceedings of 16th European Molecular Beam Epitaxy Workshop, Euro MEB 2011 | 16th European Molecular Beam Epitaxy Workshop, Euro MEB 2011 | 20/03/2011 - 23/03/2011 | AlpesFranceses, Francia

Palavras-Chave #Electrónica
Tipo

info:eu-repo/semantics/conferenceObject

Ponencia en Congreso o Jornada

PeerReviewed