XPS as Characterization Tool for PV: From the Substrate to Complete III-V Multijunction Solar Cells

Autoria(s): Gabás, M.; López-Escalante, M.C.; Algora del Valle, Carlos; Rey-Stolle Prado, Ignacio; Barrigón Montañés, Enrique; García Vara, Iván; Galiana Blanco, Beatriz; Palanco, S.; Bijani, S.; Ramos-Barrado, J.R.
Data(s)

2011
Resumo

This contribution aims to illustrate the potential of the X-ray photoelectron spectroscopy (XPS) technique as a tool to analyze different parts of a solar cell (surface state, heterointerfaces, profile composition of ohmic contacts, etc). Here, the analysis is specifically applied to III-V multijunction solar cells used in concentrator systems. The information provided from such XPS analysis has helped to understand the physico-chemical nature of these surfaces and interfaces, and thus has guided the technological process in order to improve the solar cell performance.
Formato

application/pdf
Identificador

http://oa.upm.es/12522/
Idioma(s)

eng
Publicador

E.T.S.I. Telecomunicación (UPM)
Relação

http://oa.upm.es/12522/2/INVE_MEM_2011_105957.pdf

http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6177424
Direitos

http://creativecommons.org/licenses/by-nc-nd/3.0/es/

info:eu-repo/semantics/openAccess
Fonte

Proceedings of the 37th IEEE Photovoltaic Specialists Conference, PVSC-2011 | 37th IEEE Photovoltaic Specialists Conference, PVSC-2011 | 19/06/2011 - 24/06/2011 | Seattle, EEUU
Palavras-Chave #Telecomunicaciones
Tipo

info:eu-repo/semantics/conferenceObject

Ponencia en Congreso o Jornada

PeerReviewed
Acesso ao item digital