Electrical conductivity from IODP Hole 348-C0002P


Autoria(s): Hirose, Takehiro; Saffer, Demian M; Tobin, Harold J; Toczko, Sean; Maeda, Lena; Kubo, Yusuke; Kimura, Gaku; Moore, Gregory F; Underwood, Michael B; Kanagawa, Kyuichi; Expedition 348 Scientists
Cobertura

LATITUDE: 33.440833 * LONGITUDE: 137.196944 * MINIMUM DEPTH, sediment/rock: 2070.500 m * MAXIMUM DEPTH, sediment/rock: 3050.500 m

Data(s)

04/02/2015

Formato

text/tab-separated-values, 600 data points

Identificador

https://doi.pangaea.de/10.1594/PANGAEA.842305

Idioma(s)

en

Publicador

PANGAEA

Relação

Hirose, Takehiro; Saffer, Demian M; Tobin, Harold J; Toczko, Sean; Maeda, Lena; Kubo, Yusuke (2013): NanTroSEIZE Stage 3: NanTroSEIZE plate boundary deep riser 3. IODP Scientific Prospectus, Integrated Ocean Drilling Program, doi:10.2204/iodp.sp.348.2013

Hole 348-C0002P, snapshot taken on 2015-02-04, J-CORES, SIO7 Data Center (URI: http://sio7.jamstec.go.jp/j-cores.data/348/C0002P/)

Direitos

Access constraints: access rights needed

Palavras-Chave #348-C0002P; Anisotropy, impedance horizontal; Anisotropy, impedance vertical; Chikyu; Comment; Conductivity along X-axis; Conductivity along Y-axis; Conductivity along Z-axis; Depth, bottom/max; DEPTH, sediment/rock; DRILL; Drilling/drill rig; Exp348; Impedance analysis; Integrated Ocean Drilling Program / International Ocean Discovery Program; IODP; Nankai Trough; NanTroSEIZE Plate Boundary Drilling 3; ODP sample designation; Resistivity along X-axis; Resistivity along Y-axis; Resistivity along Z-axis; Sample code/label; Sample code/label 2; Temperature, technical; Time Stamp
Tipo

Dataset