Testing the Functional Equation of High-degree Euler Products

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Autoria(s): Ryan, Nathan C; Farmer, David W.; Schmidt, Raf

Data(s)	01/01/2011
Identificador	http://digitalcommons.bucknell.edu/fac_journ/495
Publicador	Bucknell Digital Commons
Fonte	Faculty Journal Articles
Palavras-Chave	#Siegel modular forms #L-functions #Weil-Deligne representations #Number Theory
Tipo	text