Exploring the use of local binary patterns as focus measure


Autoria(s): Lorenzo Navarro, José Javier; Castrillón-Santana, Modesto; Méndez Rodríguez, Juan Ángel; Déniz Suárez, Oscar
Data(s)

12/04/2016

12/04/2016

2008

Resumo

<p>[EN]In this work local binary patterns based focus measures are presented. Local binary patterns (LBP) have been introduced in computer vision tasks like texture classification or face recognition. In applications where recognition is based on LBP, a computational saving can be achieved with the use of LBP in the focus measures. The behavior of the proposed measures is studied to test if they fulfill the properties of the focus measures and then a comparison with some well know focus measures is carried out in different scenarios.</p>

Identificador

http://hdl.handle.net/10553/16449

722132

<p><a href="http://doi.ieeecomputersociety.org/10.1109/CIMCA.2008.123" target="_blank">10.1109/CIMCA.2008.123</a></p>

Idioma(s)

eng

Direitos

info:eu-repo/semantics/openAccess

Fonte

<p>CIMCA, 2008, Computational Intelligence for Modelling, Control and Automation, International Conference on, Computational Intelligence for Modelling, Control and Automation, International Conference on 2008, pp. 855-860. ISBN 978-0-7695-3514-2</p>

Palavras-Chave #120304 Inteligencia artificial
Tipo

info:eu-repo/semantics/conferenceObject