Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films
Contribuinte(s) |
Universidade Estadual Paulista (UNESP) |
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Data(s) |
27/05/2014
27/05/2014
14/05/2013
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Resumo |
Lead zirconate titanate Pb(Zr0.50Ti0.50)O3 (PZT) thin films were deposited by a polymeric chemical method on Pt(111)/Ti/SiO2/Si substrates to understand the mechanisms of phase transformations and the effect of film thickness on the structure, dielectric, and piezoelectric properties in these films. PZT films pyrolyzed at temperatures higher than 350 °C present a coexistence of pyrochlore and perovskite phases, while only perovskite phase grows in films pyrolyzed at temperatures lower than 300 °C. For pyrochlore-free PZT thin films, a small (100)-orientation tendency near the film-substrate interface was observed. Finally, we demonstrate the existence of a self-polarization effect in the studied PZT thin films. The increase of self-polarization with the film thickness increasing from 200 nm to 710 nm suggests that Schottky barriers and/or mechanical coupling near the film-substrate interface are not primarily responsible for the observed self-polarization effect in our films. © 2013 AIP Publishing LLC. |
Identificador |
http://dx.doi.org/10.1063/1.4801961 Journal of Applied Physics, v. 113, n. 18, 2013. 0021-8979 http://hdl.handle.net/11449/75397 10.1063/1.4801961 WOS:000319294100112 2-s2.0-84878074968 2-s2.0-84878074968.pdf |
Idioma(s) |
eng |
Relação |
Journal of Applied Physics |
Direitos |
closedAccess |
Palavras-Chave | #Film-substrate interfaces #Lead zirconate titanate #Lead zirconate titanate thin films #Mechanical coupling #Perovskite phasis #Piezoelectric property #Self polarization #Thickness dependence #Film thickness #Lead #Piezoelectricity #Polarization #Polymeric films #Schottky barrier diodes #Semiconducting lead compounds #Substrates #Thin films #Titanium #Zirconium #Interfaces (materials) |
Tipo |
info:eu-repo/semantics/article |