Study of the influence of the rare earth elements (Ce3+ and Ce4+) concentration on the siloxanes coating applied on the copper surface
Contribuinte(s) |
Universidade Estadual Paulista (UNESP) |
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Data(s) |
27/05/2014
27/05/2014
01/12/2012
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Resumo |
This work studied the influence of the rare earth (Ce3+ and Ce4+) elements concentration in polysiloxane flints deposited on copper by dip-coating process, and evaluated their resistance in a 3.5 wt.% NaCl medium. Classical electrochemistry techniques were used as open circuit potential, polarization curves and electrochemical impedance spectroscopy. The results revealed that by adding low concentration of Ce4+ ions, the coating prevents the electrolyte uptake any longer retarding the substrate degradation consequently. ©The Electrochemical Society. |
Formato |
3-7 |
Identificador |
http://dx.doi.org/10.1149/1.4704931 ECS Transactions, v. 43, n. 1, p. 3-7, 2012. 1938-5862 1938-6737 http://hdl.handle.net/11449/73842 10.1149/1.4704931 2-s2.0-84879436516 |
Idioma(s) |
eng |
Relação |
ECS Transactions |
Direitos |
closedAccess |
Palavras-Chave | #Copper surface #Dip-coating process #Low concentrations #Open circuit potential #Polarization curves #Substrate degradation #Copper #Degradation #Electrochemical impedance spectroscopy #Electrochemistry #Silicon compounds #Silicones #Coatings |
Tipo |
info:eu-repo/semantics/conferencePaper |