Study of the influence of the rare earth elements (Ce3+ and Ce4+) concentration on the siloxanes coating applied on the copper surface


Autoria(s): Basho, É N.; Sakai, R. T.; Da Cruz, F. M D L; De Melo, H. G.; Benedetti, Assis Vicente; Suegama, P. H.
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

27/05/2014

27/05/2014

01/12/2012

Resumo

This work studied the influence of the rare earth (Ce3+ and Ce4+) elements concentration in polysiloxane flints deposited on copper by dip-coating process, and evaluated their resistance in a 3.5 wt.% NaCl medium. Classical electrochemistry techniques were used as open circuit potential, polarization curves and electrochemical impedance spectroscopy. The results revealed that by adding low concentration of Ce4+ ions, the coating prevents the electrolyte uptake any longer retarding the substrate degradation consequently. ©The Electrochemical Society.

Formato

3-7

Identificador

http://dx.doi.org/10.1149/1.4704931

ECS Transactions, v. 43, n. 1, p. 3-7, 2012.

1938-5862

1938-6737

http://hdl.handle.net/11449/73842

10.1149/1.4704931

2-s2.0-84879436516

Idioma(s)

eng

Relação

ECS Transactions

Direitos

closedAccess

Palavras-Chave #Copper surface #Dip-coating process #Low concentrations #Open circuit potential #Polarization curves #Substrate degradation #Copper #Degradation #Electrochemical impedance spectroscopy #Electrochemistry #Silicon compounds #Silicones #Coatings
Tipo

info:eu-repo/semantics/conferencePaper