Photorefractive phase coupling measurement using self-stabilized recording technique
Contribuinte(s) |
Universidade Estadual Paulista (UNESP) |
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Data(s) |
27/05/2014
27/05/2014
21/05/2008
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Resumo |
The measurement of the phase shift φ between the transmited and difracted beams interfering along the same direction behind the hologram recorded in a photorefractive crystal is directly and accurately measured using a self-stabilized recording technique. The measured phase shift as a function of the applied electric field allows computing the Debye screening lenght and the effectively applied field coefficient of an undoped Bi 12TiO 20 crystal. The result is in good agreement with the already available information about this sample. © 2008 American Institute of Physics. |
Formato |
332-335 |
Identificador |
http://dx.doi.org/10.1063/1.2926880 AIP Conference Proceedings, v. 992, p. 332-335. 0094-243X 1551-7616 http://hdl.handle.net/11449/70414 10.1063/1.2926880 2-s2.0-43649103073 2-s2.0-43649103073.pdf |
Idioma(s) |
eng |
Relação |
AIP Conference Proceedings |
Direitos |
closedAccess |
Tipo |
info:eu-repo/semantics/conferencePaper |