Photorefractive phase coupling measurement using self-stabilized recording technique


Autoria(s): Montenegro, R.; De Oliveira, I.; Freschi, A. A.; Frejlich, J.
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

27/05/2014

27/05/2014

21/05/2008

Resumo

The measurement of the phase shift φ between the transmited and difracted beams interfering along the same direction behind the hologram recorded in a photorefractive crystal is directly and accurately measured using a self-stabilized recording technique. The measured phase shift as a function of the applied electric field allows computing the Debye screening lenght and the effectively applied field coefficient of an undoped Bi 12TiO 20 crystal. The result is in good agreement with the already available information about this sample. © 2008 American Institute of Physics.

Formato

332-335

Identificador

http://dx.doi.org/10.1063/1.2926880

AIP Conference Proceedings, v. 992, p. 332-335.

0094-243X

1551-7616

http://hdl.handle.net/11449/70414

10.1063/1.2926880

2-s2.0-43649103073

2-s2.0-43649103073.pdf

Idioma(s)

eng

Relação

AIP Conference Proceedings

Direitos

closedAccess

Tipo

info:eu-repo/semantics/conferencePaper