Double optical monitoring of time-dependent film formation


Autoria(s): Michels, Alexandre F.; Menegotto, Thiago; Grieneisen, Hans Peter H.; Santilli, Celso Valentim; Horowitz, Flavio
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

27/05/2014

27/05/2014

23/12/2005

Resumo

A brief overview of optical monitoring for vacuum and wet bench film deposition processes is presented. Interferometric and polarimetric measurements are combined with regard to simultaneous real-time monitoring of refractive index and physical thickness. Monitor stability and accuracy are verified with transparent oil standards. This double optical technique is applied to dip coating with a multi-component Zirconyl Chloride aqueous solution, whose time varying refractive index and physical thickness curves indicate significant sensitivity to changes of film flow properties during the process.

Formato

1-6

Identificador

http://dx.doi.org/10.1117/12.617967

Proceedings of SPIE - The International Society for Optical Engineering, v. 5870, p. 1-6.

0277-786X

http://hdl.handle.net/11449/68697

10.1117/12.617967

2-s2.0-29144506747

Idioma(s)

eng

Relação

Proceedings of SPIE - The International Society for Optical Engineering

Direitos

closedAccess

Palavras-Chave #Optical properties #Quality control #Reflection #Refractive index #Optical monitoring #Physical thickness #Polarimetric measurements #Thin films
Tipo

info:eu-repo/semantics/conferencePaper