Double optical monitoring of time-dependent film formation
Contribuinte(s) |
Universidade Estadual Paulista (UNESP) |
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Data(s) |
27/05/2014
27/05/2014
23/12/2005
|
Resumo |
A brief overview of optical monitoring for vacuum and wet bench film deposition processes is presented. Interferometric and polarimetric measurements are combined with regard to simultaneous real-time monitoring of refractive index and physical thickness. Monitor stability and accuracy are verified with transparent oil standards. This double optical technique is applied to dip coating with a multi-component Zirconyl Chloride aqueous solution, whose time varying refractive index and physical thickness curves indicate significant sensitivity to changes of film flow properties during the process. |
Formato |
1-6 |
Identificador |
http://dx.doi.org/10.1117/12.617967 Proceedings of SPIE - The International Society for Optical Engineering, v. 5870, p. 1-6. 0277-786X http://hdl.handle.net/11449/68697 10.1117/12.617967 2-s2.0-29144506747 |
Idioma(s) |
eng |
Relação |
Proceedings of SPIE - The International Society for Optical Engineering |
Direitos |
closedAccess |
Palavras-Chave | #Optical properties #Quality control #Reflection #Refractive index #Optical monitoring #Physical thickness #Polarimetric measurements #Thin films |
Tipo |
info:eu-repo/semantics/conferencePaper |