Influence of heat treatment on LiNbO3 thin films prepared on Si(111) by the polymeric precursor method


Autoria(s): Bouquet, V.; Longo, Elson; Leite, E. R.; Varela, José Arana
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

27/05/2014

27/05/2014

01/07/1999

Resumo

The effects of heat-treatment temperature on LiNbO3 thin films prepared by the polymeric precursor method were investigated. The precursor solution was deposited on Si(111) substrates by dip coating. X-ray diffraction and thermal analyses revealed that the crystallization process occurred at a low temperature (420 °C) and led to films with no preferential orientation. High-temperature treatments promoted formation of the LiNb3O8 phase. Scanning electron microscopy, coupled with energy dispersive spectroscopy analyses, showed that the treatment temperature also affected the film microstructure. The surface texture - homogeneous, smooth, and pore-free at low temperature - turned into an `islandlike' microstructure for high-temperature treatments.

Formato

3115-3121

Identificador

http://dx.doi.org/10.1557/JMR.1999.0418

Journal of Materials Research, v. 14, n. 7, p. 3115-3121, 1999.

0884-2914

http://hdl.handle.net/11449/65803

10.1557/JMR.1999.0418

WOS:000082550700059

2-s2.0-0032662623

2-s2.0-0032662623.pdf

Idioma(s)

eng

Relação

Journal of Materials Research

Direitos

closedAccess

Palavras-Chave #Crystal microstructure #Crystal orientation #Crystallization #Ferroelectric materials #Film preparation #Heat treatment #Lithium niobate #Piezoelectric materials #Silicon wafers #Surface structure #Thermal effects #Thin films #Polymeric precursor method #Dielectric films
Tipo

info:eu-repo/semantics/article