Influence of heat treatment on LiNbO3 thin films prepared on Si(111) by the polymeric precursor method
Contribuinte(s) |
Universidade Estadual Paulista (UNESP) |
---|---|
Data(s) |
27/05/2014
27/05/2014
01/07/1999
|
Resumo |
The effects of heat-treatment temperature on LiNbO3 thin films prepared by the polymeric precursor method were investigated. The precursor solution was deposited on Si(111) substrates by dip coating. X-ray diffraction and thermal analyses revealed that the crystallization process occurred at a low temperature (420 °C) and led to films with no preferential orientation. High-temperature treatments promoted formation of the LiNb3O8 phase. Scanning electron microscopy, coupled with energy dispersive spectroscopy analyses, showed that the treatment temperature also affected the film microstructure. The surface texture - homogeneous, smooth, and pore-free at low temperature - turned into an `islandlike' microstructure for high-temperature treatments. |
Formato |
3115-3121 |
Identificador |
http://dx.doi.org/10.1557/JMR.1999.0418 Journal of Materials Research, v. 14, n. 7, p. 3115-3121, 1999. 0884-2914 http://hdl.handle.net/11449/65803 10.1557/JMR.1999.0418 WOS:000082550700059 2-s2.0-0032662623 2-s2.0-0032662623.pdf |
Idioma(s) |
eng |
Relação |
Journal of Materials Research |
Direitos |
closedAccess |
Palavras-Chave | #Crystal microstructure #Crystal orientation #Crystallization #Ferroelectric materials #Film preparation #Heat treatment #Lithium niobate #Piezoelectric materials #Silicon wafers #Surface structure #Thermal effects #Thin films #Polymeric precursor method #Dielectric films |
Tipo |
info:eu-repo/semantics/article |