Correlation of electrical conductivity and other vigor tests with field emergence of soybean seedlings


Autoria(s): Vieira, Roberval Daiton; Paiva-Aguero, J. A.; Perecin, D.; Bittencourt, S. R M
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

27/05/2014

27/05/2014

01/01/1999

Resumo

Seeds from six soybean cultivars (Cristalina, IAC 31-Foscarin, IAC-15, UFV-10, IAC-14 and IAS-5) and from five soybean cultivars (IAC 31-Foscarin, IAC-15, IAC-14, IAS-5 and Iguacu) were evaluated in 1993 and 1994, respectively, in terms of physiological seed quality by the mechanical damage (MD), standard germination (SG), accelerated aging (AA), electrical conductivity (EC), and seedling field emergence (FE) tests. Significant correlations were detected between SG, AA and EC and FE. However, in terms of the cultivar or the year, the degree of association among these parameters can change based on the environmental conditions of each year.

Formato

67-75

Identificador

Seed Science and Technology, v. 27, n. 1, p. 67-75, 1999.

0251-0952

http://hdl.handle.net/11449/65706

WOS:000081977800007

2-s2.0-0032875979

Idioma(s)

eng

Relação

Seed Science and Technology

Direitos

closedAccess

Tipo

info:eu-repo/semantics/article