Structural and dielectric properties of Ba0.5Sr0.5(SnxTi1-x)O-3 ceramics obtained by the soft chemical method


Autoria(s): Souza, I. A.; Cavalcante, L. S.; Sczancoski, J. C.; Moura, F.; Paiva-Santos, C. O.; Varela, José Arana; Simões, Alexandre Zirpoli; Longo, Elson
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

27/05/2009

Resumo

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Ba0.5Sr0.5(SnxTi1-x)O-3 ceramics with different compositions (x = 0, 0.05, 0.10 and 0.20) were synthesized by the soft chemical method. X-ray diffraction patterns and Rietveld refinements revealed that these ceramics crystallize in a cubic structure. Secondary phases (BaSnO3) were verified in Ba0.5Sr0.5(SnxTi1-x)O-3 ceramics with Sn content x >= 0.10. Raman spectra indicated a reduction in the Raman-active modes with the increase of Sn content in the lattice. Dilatometric measurements were used to analyze the sintering temperature behavior of these materials. Dielectric properties were investigated as a function of applied frequency. The increase in the remanent polarization was attributed to the imprint phenomenon due to the formation of oxygen vacancies. The domain pinning and the formation of BaSnO3 phase favored the increase in the coercive fields. (C) 2008 Elsevier B.V. All rights reserved.

Formato

877-882

Identificador

http://dx.doi.org/10.1016/j.jallcom.2008.11.042

Journal of Alloys and Compounds. Lausanne: Elsevier B.V. Sa, v. 477, n. 1-2, p. 877-882, 2009.

0925-8388

http://hdl.handle.net/11449/42018

10.1016/j.jallcom.2008.11.042

WOS:000266386400173

Idioma(s)

eng

Publicador

Elsevier B.V. Sa

Relação

Journal of Alloys and Compounds

Direitos

closedAccess

Palavras-Chave #Ceramics #Chemical synthesis #Dielectric #X-ray diffraction
Tipo

info:eu-repo/semantics/article