Level crossing rate of Nakagami-m fading signal: Field trials and validation


Autoria(s): Yacoub, M. D.; Barbin, M. V.; de Castro, M. S.; Vargas, J. E.
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

17/02/2000

Resumo

Field trial measurements are used to validate the level crossing rate formula derived in an exact manner recently for the Nakagami-m signal. The formula reveals an excellent fit to measurements in situations other than those for which the Rice model is more appropriate.

Formato

355-357

Identificador

http://dx.doi.org/10.1049/el:20000295

Electronics Letters. Hertford: IEE-inst Elec Eng, v. 36, n. 4, p. 355-357, 2000.

0013-5194

http://hdl.handle.net/11449/39479

10.1049/el:20000295

WOS:000085671500048

Idioma(s)

eng

Publicador

Institute of Electrical and Electronics Engineers (IEEE)

Relação

Electronics Letters

Direitos

closedAccess

Tipo

info:eu-repo/semantics/article