Microwave synthesis of calcium bismuth niobate thin films obtained by the polymeric precursor method


Autoria(s): Simoes, A. Z.; Ramirez, M. A.; Ries, A.; Wang, F.; Longo, Elson; Varela, José Arana
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

10/08/2006

Resumo

The crystal structure, surface morphology and electrical properties of layered perovskite calcium bismuth niobate thin films (CaBi2Nb2O9-CBN) deposited on platinum coated silicon substrates by the polymeric precursor method have been investigated. The films were crystallized in a domestic microwave and in a conventional furnace. X-ray diffraction and atomic force microscopy analysis confirms that the crystallinity and morphology of the films are affected by the different annealing routes. Ferroelectric properties of the films were determined with remanent polarization P-r and a drive voltage V-c of 4.2 mu C/cm(2) and 1.7 V for the film annealed in the conventional furnace and 1.0 mu C/cm(2) and 4.0 V for the film annealed in microwave furnace, respectively. A slight decay after 10(8) polarization cycles was observed for the films annealed in the microwave furnace indicating a reduction of the domain wall mobility after interaction of the microwave energy with the bottom electrode. (C) 2006 Elsevier Ltd. All rights reserved.

Formato

1461-1467

Identificador

http://dx.doi.org/10.1016/j.materresbull.2006.01.025

Materials Research Bulletin. Oxford: Pergamon-Elsevier B.V., v. 41, n. 8, p. 1461-1467, 2006.

0025-5408

http://hdl.handle.net/11449/37402

10.1016/j.materresbull.2006.01.025

WOS:000239253500008

Idioma(s)

eng

Publicador

Elsevier B.V.

Relação

Materials Research Bulletin

Direitos

closedAccess

Palavras-Chave #thin films #X-ray diffraction #ferroelectricity
Tipo

info:eu-repo/semantics/article