Fatigue-free behavior of Bi3.25La0.75Ti3O12 thin films grown on several bottom eletrodes by the polymeric precursor method
| Contribuinte(s) |
Universidade Estadual Paulista (UNESP) |
|---|---|
| Data(s) |
20/05/2014
20/05/2014
13/12/2004
|
| Resumo |
Fatigue-free Bi3.25La0.75Ti3O12 (BLT) thin films were grown on LaNiO3,RuO2, and La0.5Sr0.5CoO3 bottom electrodes in a microwave furnace at 700 degreesC for 10 min. The remanent polarization (P-r) and the drive voltage (V-c) were in the range of 11-23 muC/cm(2) and 0.86-1.56 V, respectively, and are better than the values found in the literature. The BLT capacitors did not show any significant fatigue up to 10(10) read/write switching cycles. (C) 2004 American Institute of Physics. |
| Formato |
5962-5964 |
| Identificador |
http://dx.doi.org/10.1063/1.1834999 Applied Physics Letters. Melville: Amer Inst Physics, v. 85, n. 24, p. 5962-5964, 2004. 0003-6951 http://hdl.handle.net/11449/37253 10.1063/1.1834999 WOS:000225620200049 WOS000225620200049.pdf |
| Idioma(s) |
eng |
| Publicador |
American Institute of Physics (AIP) |
| Relação |
Applied Physics Letters |
| Direitos |
closedAccess |
| Tipo |
info:eu-repo/semantics/article |
