Single-exposure, photorefractive holographic surface contouring with multiwavelength diode lasers


Autoria(s): Barbosa, E. A.; Filho, AAV; Gesualdi, MRR; Curcio, B. G.; Muramatsu, M.; Soga, D.
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

01/12/2005

Resumo

We studied the use of multiwavelength diode lasers for surface profilometry through holographic recording in sillenite Bi(12)TiO(20) crystals. When such lasers are used, the holographic image from single-exposure recordings appears covered with interference fringes providing information on the surface relief of the object. By taking advantage of the narrow interference fringes due to the multiwavelength emission of the laser, we obtained interferograms by holographic recording with two reference beams, which improves the surface analysis by visual inspection and enhances the profilometry sensitivity. (c) 2005 Optical Society of America.

Formato

2872-2879

Identificador

http://dx.doi.org/10.1364/JOSAA.22.002872

Journal of the Optical Society of America A-optics Image Science and Vision. Washington: Optical Soc Amer, v. 22, n. 12, p. 2872-2879, 2005.

1084-7529

http://hdl.handle.net/11449/35089

10.1364/JOSAA.22.002872

WOS:000234020500032

Idioma(s)

eng

Publicador

Optical Soc Amer

Relação

Journal of the Optical Society of America A-optics Image Science and Vision

Direitos

closedAccess

Tipo

info:eu-repo/semantics/article