Electromechanical properties of calcium bismuth titanate films: A potential candidate for lead-free thin-film piezoelectrics


Autoria(s): Simoes, A. Z.; Ramirez, M. A.; Ries, A.; Varela, José Arana; Longo, Elson; Ramesh, R.
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

13/02/2006

Resumo

CaBi4Ti4O15 (CBTi144) thin films were evaluated for use as lead-free thin-film piezoelectrics in microelectromechanical systems. The films were grown by the polymeric precursor method on (100)Pt/Ti/SiO2/Si substrates. The a/b-axis orientation of the ferroelectric film is considered to be associated with the preferred orientation of the Pt bottom electrode. The P-r and E-c were 14 mu C/cm(2) and 64 kV/cm, respectively, for a maximum applied field of 400 kV/cm. The domain structure was investigated by piezoresponse force microscopy. The film has a piezoelectric coefficient, d(33), equal to 60 pm/V and a current density of 0.7 mA/cm(2).

Formato

3

Identificador

http://dx.doi.org/10.1063/1.2172071

Applied Physics Letters. Melville: Amer Inst Physics, v. 88, n. 7, 3 p., 2006.

0003-6951

http://hdl.handle.net/11449/33999

10.1063/1.2172071

WOS:000235393700080

WOS000235393700080.pdf

Idioma(s)

eng

Publicador

American Institute of Physics (AIP)

Relação

Applied Physics Letters

Direitos

closedAccess

Tipo

info:eu-repo/semantics/article