Spectroscopic characterization of BPSCCO thin films grown by dip-coating technique


Autoria(s): Carvalho, C. L.; Guedes, I
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

01/07/2003

Resumo

This work describes the growth of Bi2-xPbxSr2Can-1CunO2n+4 thin films by the dip-coating technique for 0.4 less than or equal to x less than or equal to 1. X-ray and Raman spectroscopic techniques were carried out in order to characterize the films at room temperature. From X-ray data it is observed that the films are multi-phased presenting phases 2201, 2212 and 2223 along with the undesirable Ca2PbO4 phase. It is also observed that phase 2212 becomes dominant when Pb content increases. The Raman modes observed agree with the overall features expected for these compounds. (C) 2003 Elsevier B.V. B.V. All rights reserved.

Formato

239-242

Identificador

http://dx.doi.org/10.1016/S0921-4534(03)00701-9

Physica C-superconductivity and Its Applications. Amsterdam: Elsevier B.V., v. 390, n. 3, p. 239-242, 2003.

0921-4534

http://hdl.handle.net/11449/33613

10.1016/S0921-4534(03)00701-9

WOS:000183462600008

Idioma(s)

eng

Publicador

Elsevier B.V.

Relação

Physica C: Superconductivity and its Applications

Direitos

closedAccess

Palavras-Chave #BPSSCO thin films #dip-coating technique #X-ray diffraction #Raman scattering
Tipo

info:eu-repo/semantics/article