Effect of niobium dopant on fatigue characteristics of BiFeO3 thin films grown on Pt electrodes


Autoria(s): Simões, Alexandre Zirpoli; Pianno, R. F.; Aguiar, E. C.; Longo, Elson; Varela, José Arana
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

24/06/2009

Resumo

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Pure BiFeO3 (BFO) and Nb-doped (BFN) thin films were fabricated by the soft chemical method. The films were polycrystalline when deposited on Pt/Ti/SiO2/Si substrate and annealed at 500 degrees C for 2 h. X-ray diffraction analysis revealed that the film was fully crystallized. The grain size decreased in the BFN films due the suppression of oxygen vacancy concentration in the BFO lattice. The Nb dopant is effective in improving electrical properties of BFO films. With increase niobium content we obtained thin films free of fatigue up to 10(8) cycles. (C) 2009 Published by Elsevier B.V.

Formato

274-279

Identificador

http://dx.doi.org/10.1016/j.jallcom.2009.01.074

Journal of Alloys and Compounds. Lausanne: Elsevier B.V. Sa, v. 479, n. 1-2, p. 274-279, 2009.

0925-8388

http://hdl.handle.net/11449/25668

10.1016/j.jallcom.2009.01.074

WOS:000267063300069

Idioma(s)

eng

Publicador

Elsevier B.V. Sa

Relação

Journal of Alloys and Compounds

Direitos

closedAccess

Palavras-Chave #Ferroelectrics #Thin films #Chemical synthesis #X-ray diffraction #Transmission electron microscopy
Tipo

info:eu-repo/semantics/article