Photocatalyst TiO2-Co: the effect of doping depth profile on methylene blue degradation


Autoria(s): Carvalho, Hudson W. P.; Batista, Ana P. L.; Bertholdo, Roberto; Santilli, Celso Valentim; Pulcinelli, Sandra Helena; Ramalho, Teodorico C.
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

01/10/2010

Resumo

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

In this work, we study the effect of doping depth profile on the photocatalytic and surface properties of TiO2 films. Two thin film layers of TiO2 (200 nm) and Co (5 nm), respectively, were deposited by physical evaporation on glass substrate. These films were annealed for 1 s at 100 and 400 A degrees C and the Co layer was removed by chemical etching. Atomic force microscopy (AFM) phase images showed changes in the surface in function of thermal treatment. The grazing-incidence X-ray fluorescence (GIXRF) measurements indicated that the thermal treatment caused migration of Co atoms to below the surface, the depths found were between 19 and 29 nm. The contact angle showed distinct values in function of the doped profile or Co surface concentration. The UV-vis spectra presented a red shift with the increasing of thermal treatment. Photocatalytical assays were performed by methylene blue discoloration and the higher activity was found for TiO2-Co treated at 400 A degrees C, the ESI-MS showed the fragments formed during the methylene blue decomposition.

Formato

5698-5703

Identificador

http://dx.doi.org/10.1007/s10853-010-4639-5

Journal of Materials Science. New York: Springer, v. 45, n. 20, p. 5698-5703, 2010.

0022-2461

http://hdl.handle.net/11449/25623

10.1007/s10853-010-4639-5

WOS:000280959200035

Idioma(s)

eng

Publicador

Springer

Relação

Journal of Materials Science

Direitos

closedAccess

Tipo

info:eu-repo/semantics/article