Impedance spectroscopy analysis of SnO2 thick-films gas sensors


Autoria(s): Ponce, M. A.; Bueno, Paulo Roberto; Varela, José Arana; Castro, M. S.; Aldao, C. M.
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

01/12/2008

Resumo

A careful analysis of the impedance response of SnO2 thick films under vacuum and air atmosphere is reported in the present work. The AC electrical resistance was analyzed and it was shown that it is highly frequency dependent. Different models and its equivalent circuit representation were proposed and carefully analyzed based on the microstructure features of the device. Basically, an interpretation of the frequency dependent resistance was proposed based on the fact that different grains characteristics and junctions exist. These different grains and junctions are the main source of resistance dependent feature. An equivalent circuit model, considering different grain sizes associated with different grain boundary junctions characteristics, was introduced so that a consistent interpretation of the results was possible.

Formato

1169-1175

Identificador

http://dx.doi.org/10.1007/s10854-007-9517-9

Journal of Materials Science-materials In Electronics. Dordrecht: Springer, v. 19, n. 12, p. 1169-1175, 2008.

0957-4522

http://hdl.handle.net/11449/25610

10.1007/s10854-007-9517-9

WOS:000260191000005

Idioma(s)

eng

Publicador

Springer

Relação

Journal of Materials Science: Materials in Electronics

Direitos

closedAccess

Tipo

info:eu-repo/semantics/article