Effect of annealing atmosphere on phase formation and electrical characteristics of bismuth ferrite thin films


Autoria(s): Simões, Alexandre Zirpoli; Riccardi, C. S.; Dos Santos, M. L.; Garcia, F. Gonzalez; Longo, Elson; Varela, José Arana
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

05/08/2009

Resumo

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Bismuth ferrite thin films were deposited on Pt/Ti/SiO(2)/Si substrates by a soft chemical method and spin-coating technique. The effect of annealing atmosphere (air, N(2) and O(2)) on the structure and electrical properties of the films are reported. X-ray diffraction analysis reveals that the film annealed in air atmosphere is a single-phase perovskite structure. The films annealed in air showed better crystallinity and the presence of a single BFO phase leading to lower leakage current density and superior ferroelectric hysteresis loops at room temperature. In this way, we reveal that BFO film crystallized in air atmosphere by the soft chemical method can be useful for practical applications, including nonvolatile digital memories, spintronics and data-storage media. (C) 2009 Elsevier Ltd. All rights reserved.

Formato

1747-1752

Identificador

http://dx.doi.org/10.1016/j.materresbull.2009.03.011

Materials Research Bulletin. Oxford: Pergamon-Elsevier B.V. Ltd, v. 44, n. 8, p. 1747-1752, 2009.

0025-5408

http://hdl.handle.net/11449/25561

10.1016/j.materresbull.2009.03.011

WOS:000267725300026

Idioma(s)

eng

Publicador

Pergamon-Elsevier B.V. Ltd

Relação

Materials Research Bulletin

Direitos

closedAccess

Palavras-Chave #Thin films #Chemical synthesis #Atomic force microscopy #Ferroelectricity
Tipo

info:eu-repo/semantics/article