Influence of thickness on crystallization and properties of LiNbO3 thin films


Autoria(s): Simoes, A. Z.; Gonzalez, AHM; Ries, A.; Zaghete, M. A.; Stojanovic, B. D.; Varela, José Arana
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

01/03/2003

Resumo

Thin films of lithium niobate were deposited on Pt/Ti/SiO2 (111) substrates by spin coating from the polymeric precursor method (Pechini process). Annealing in static air was performed at 500 degreesC for 3 h. The obtained films were characterized by X-ray diffraction and atomic force microscopy. The dielectric constant, dissipation factor and resistance were measured in frequency region from 10 Hz to 10 MHz and the hysteresis loop was obtained. The influence of number of layers on crystallization, morphology and properties of LiNbO3 thin films is discussed. (C) 2003 Elsevier B.V. All rights reserved.

Formato

239-244

Identificador

http://dx.doi.org/10.1016/S1044-5803(03)00089-5

Materials Characterization. New York: Elsevier B.V., v. 50, n. 2-3, p. 239-244, 2003.

1044-5803

http://hdl.handle.net/11449/25423

10.1016/S1044-5803(03)00089-5

WOS:000186249900025

Idioma(s)

eng

Publicador

Elsevier B.V.

Relação

Materials Characterization

Direitos

closedAccess

Palavras-Chave #LiNbO3 #crystallization #electrical properties
Tipo

info:eu-repo/semantics/article