Synthesis and characterization of CaBi4Ti4O15 thin films annealed by microwave and conventional furnaces


Autoria(s): Simoes, A. Z.; Riccardi, C. S.; Ramirez, M. A.; Cavalcante, L. S.; Longo, Elson; Varela, José Arana
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

01/08/2007

Resumo

CaBi4Ti4O15 thin films were deposited by the polymeric precursor method and crystallized in a domestic microwave oven and conventional furnace. The films obtained for microwave energy are well-adhered, homogeneous and with good specularity, when treated at 700 degrees C for 10 min. The microstructure and the structure of the films can be tuned by adjusting the crystallization conditions. When microwave oven is employed, the films presented bigger grains with mean grain size around 80 nm. For comparison, films were also prepared by the conventional furnace at 700 degrees C for 2 h. (C) 2007 Elsevier Masson SAS. All rights reserved.

Formato

756-760

Identificador

http://dx.doi.org/10.1016/j.solidstatesciences.2007.05.003

Solid State Sciences. Amsterdam: Elsevier B.V., v. 9, n. 8, p. 756-760, 2007.

1293-2558

http://hdl.handle.net/11449/25383

10.1016/j.solidstatesciences.2007.05.003

WOS:000249522400017

Idioma(s)

eng

Publicador

Elsevier B.V.

Relação

Solid State Sciences

Direitos

closedAccess

Palavras-Chave #bismuth layer #crystallization #microwave oven #ferroelectric properties
Tipo

info:eu-repo/semantics/article