Stabilized photorefractive running holograms, with arbitrarily selected phase shift, for material characterization


Autoria(s): de Oliveira, Ivan; Freschi, Agnaldo A.; Fier, Igor; Frejlich, Jaime
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

30/09/2013

20/05/2014

30/09/2013

20/05/2014

01/03/2012

Resumo

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

We report on the recording of stabilized running holograms in photorefractive materials with arbitrarily selected phase shift phi between the transmitted and difracted beams propagating along the same direction behind the photorefractive crystal. The dependence of the diffraction efficiency and of the hologram speed on phi, in such stabilized holograms, can be easily measured and used for material characterization. In this communication we applied for the first time this technique for studying and characterizing hole-electron competition in a nominally undoped titanosillenite crystal sample. (C) 2012 Optical Society of America

Formato

228-234

Identificador

http://dx.doi.org/10.1364/OME.2.000228

Optical Materials Express. Washington: Optical Soc Amer, v. 2, n. 3, p. 228-234, 2012.

2159-3930

http://hdl.handle.net/11449/25027

10.1364/OME.2.000228

WOS:000302956100001

WOS000302956100001.pdf

Idioma(s)

eng

Publicador

Optical Soc Amer

Relação

Optical Materials Express

Direitos

openAccess

Tipo

info:eu-repo/semantics/article