Stabilized photorefractive running holograms, with arbitrarily selected phase shift, for material characterization
Contribuinte(s) |
Universidade Estadual Paulista (UNESP) |
---|---|
Data(s) |
30/09/2013
20/05/2014
30/09/2013
20/05/2014
01/03/2012
|
Resumo |
Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES) We report on the recording of stabilized running holograms in photorefractive materials with arbitrarily selected phase shift phi between the transmitted and difracted beams propagating along the same direction behind the photorefractive crystal. The dependence of the diffraction efficiency and of the hologram speed on phi, in such stabilized holograms, can be easily measured and used for material characterization. In this communication we applied for the first time this technique for studying and characterizing hole-electron competition in a nominally undoped titanosillenite crystal sample. (C) 2012 Optical Society of America |
Formato |
228-234 |
Identificador |
http://dx.doi.org/10.1364/OME.2.000228 Optical Materials Express. Washington: Optical Soc Amer, v. 2, n. 3, p. 228-234, 2012. 2159-3930 http://hdl.handle.net/11449/25027 10.1364/OME.2.000228 WOS:000302956100001 WOS000302956100001.pdf |
Idioma(s) |
eng |
Publicador |
Optical Soc Amer |
Relação |
Optical Materials Express |
Direitos |
openAccess |
Tipo |
info:eu-repo/semantics/article |